SNUG-2012 Verification Round Up: VCS Technologies
Posted by paragg on March 15th, 2013
Continuing from my earlier blog posts about SNUG papers on the SystemVerilog language and verification methodologies, I will now go through some of the interesting papers that highlight core technologies in VCS which users can deploy to improve their productivity. We will walk through various stages of the verification cycle including simulation bring up, RTL simulation, gate-level simulation, regression and simulation debug which each benefit from different features and technologies in VCS.
Beating the SoC challenges
One of the biggest challenges that today’s complex SoC architectures pose is rigorous verification of SoC designs. Functional verification of the full-system represented by these mammoth scale (> 1 billion transistors per chip) designs calls for the verification environment to employ advanced methodologies, powerful tools and techniques. Constrained-random stimulus generation, coverage-driven-completion criteria, assertion-based checking, faster triage and debug turnaround, C/C++/SystemC co-simulation, gate-level verification, etc. are just some of these methods and techniques which aid in tackling the challenge. Patrick Hamilton, Richard Yin, Bobjee Nibhanupudi, Amol Bhinge of Freescale in their paper “SoC Simulation Performance: Bottlenecks and Remedies” discuss the several simulation and debug bottlenecks experienced during the verification of a complex next-generation SoC; they discuss how they gained knowledge of these bottlenecks and overcame them using VCS diagnostic capabilities, profile reports, VCS arguments, testbench modifications, smarter utilities, fine tuning of computing resources, etc.
The challenge of simulation environment is the sheer amount of tests that are being written and need to be managed. As more tests are added to the regressions, there is a quantifiable impact on several aspects of the project. These include a dramatic and unsustainable increase in the overall regression time. As the regression time increases, the intermediate interval for collecting and analyzing results between successive regressions run shrinks. Overlaps arising from having multiple regressions in flight can cause failure to track design bugs for several snapshots, which can also result in the inability to ensure coverage tracking by design management tools. Given constantly shortening project timelines, this affects the time-to-market of core designs and their dependent SoC products. “Simulation-based Productivity Enhancements using VCS Save/Restore” by Scot Hildebrandt, Lloyd Cha, AMD, Inc. looks at using VCS’s Save/Restore feature to develop steps involving binary image capture of sections of simulation. These “sections” consist of aspects replicated in all tests, like the reset sequence, or allow the skipping of the specific phases of a failing test which are ‘clean’. They further provide statistics in terms of the reduction in the regression time and the memory footprint that the saved image would typically enable. They also talk about how the dynamic re-seeding of the test case with the stored images enabled them to leverage the full strength and capabilities of the CRV methodologies.
The paper “SoC Compilation and Runtime Optimization using VCS” by Santhosh K.R., Sreenath Mandagani of Mindspeed Technologies(India) talks about the Partition Compile flow and associated methodology to improve TAT(turnaround time) for SOC compilations. The flow leverages v2k configurations, parallel compilation and various performance optimization switches of VCS-MX. They further explain how a SoC can be partitioned into multiple functional blocks or clusters and each block can be selectively replaced with empty shells if that particular functionality is not exercised in the desired tests. Also the paper demonstrates how new tests can be added and run without requiring to recompile the whole SoC. Thus using Partition Compile flow, only a subset of SoC or test bench blocks would be recompiled based on the dependencies across clusters. They share the productivity gains in compile TAT as well, overall runtime gains for the current SoC and the savings in overall disk space requirement. This is then shown to correlate with the reduction in the license usage time and disk space which leads to savings desired.
By the way, now there been further developments in the latest VCS release to help ensure isolation of switches between partitions in the SoC. This additional functionality helps reduce memory, decrease runtime, and reduce initial scratch compile time even further while maintaining the advantages of partition compile.
Addressing the X-optimism challenges – X-prop Technology
Gate simulations are onerous and many of the risks normally mitigated by gate simulations can now be addressed by RTL lint tools, static timing analysis tools and logic equivalence checking. However, one risk that persists, until now, is the potential for optimism in the X semantics of RTL simulation. The semantics of the Verilog language can create mismatches between RTL and gate-level simulation due to X-optimism Also, the semantics of X’s in gate simulations are pessimistic resulting in simulation failures that don’t represent real bugs.
“Improved X-Propagation using the xProp technology” by Rafi Spigelman of Intel Corporation presents the motivation for having the relevant semantics for X-propagation. The process of how such semantics was validated and deployed on a major CPU design at Intel is also described. He delves upon its merits and limitations, and comments on the effort required in enabling such semantics in the RTL regressions.
Robert Booth of Freescale Inc. in the paper “X-Optimism Elimination during RTL Verification” explains how the chips suffer from X-optimism issues that often conceal design bugs. The deployment of low power techniques such as power-shutdown in today’s designs exacerbates these X-optimism issues. To address these problems they show how they leverage the new simulation semantics with VCS that more accurately models non-deterministic values in logic simulation. The paper describes how X-optimism can be eliminated during RTL verification.
In the paper “X-Propagation: An Alternative to Gate Level Simulation”, Adrian Evans, Julius Yam, Craig Forward @cisco.com explores X-Propagation technology which attempts to model X behavior more accurately at the RTL level. In this paper, they review the sources of X’s in simulation and their handling in the Verilog language. They further describe their experience using this feature on design blocks from Cisco ASICs including several simulation failures that did not represent RTL bugs. They conclude by suggesting how X-Propagation can be used to reduce and potentially eliminate gate-level simulations.
In the paper “Improved x-propagation semantics: CPU server learning”, Peeyush Purohit, Ashish Alexander, Anees Sutarwala of Intel stresses on the need to model and simulate silicon like behavior in RTL simulations. They bring out the fact that traditionally Gate-Level Simulations have been used to fill that void but come at the cost of time and resources. Then they go on to explain the limitations with the regular 4-value Verilog/System Verilog based RTL simulation and also cover the specifications for enhanced simulator semantics to overcome those limitations. They explain how design issues that were found on their next-generation CPU server project used the enhanced semantics; the potential flow implications and a sample methodology implementing the new semantics are provided.
Power-on-Reset (POR) is a key functional sequence for all SoC designs and any bug not detected in this logic can lead to dead silicon. Complexities in reset logic pose increasing challenges for verification engineers to catch any such design issue(s) during RTL/GL simulations. POR sequence simulations are many times accompanied by ‘X’ propagation due to non-resettable flops and un-initialized logic. Generally uninitialized and non-resettable logic is initialized to 0’s or 1’s or some random values using Forces or Deposits to bypass unwanted X propagation. Ideally, one would like to have a stimulus to try all possible combinations of initial values for such logic but this is practically impossible due to short design cycle and limited resources. This practical limitation can leave space for critical design bugs that may remain undetected during the design verification cycle. Deepak Jindal, Freescale, India in the paper “Gaps and Challenges with Reset Logic Verification” discusses these reset logic simulation challenges in detail and shares the experience of evaluating the new semantics in VCS technology which can help to catch most of the POR bugs/issues during RTL stage itself.
SNUG allows users to discuss their current challenges and emerging solutions they are using to address them. You can find all SNUG papers online via solvnet (Of course a login required!!!).