Verification Martial Arts: A Verification Methodology Blog

Moving from Block levels tests to a Chip level in a reusable world…

Posted by Srivatsa Vasudevan on January 29th, 2010

In modern designs, one observes a fairly high degree of reuse in designs and verification environments. Cores and blocks are regularly reused from one design to another and increasing demands are being placed on quickly getting a functional chip out of the door to meet a customer need.

In such a world, schedule and functional chips are key to success.

At the block level, the design and verification engineers use a white box testing methodology to write tests that will completely test out the block under test. Usually in these environments, various blocks that interact with the design under test will usually be stubbed out or replaced with transactors as the case may be.

In an ideal world, the tests which were written once for the block level verification if reused 100% at the chip level would mean that the reuse was at 100%. That never usually happens.

Let’s look at the illustration between a verification engineer who’s busy building cores at the block level, comes in to talk to the verification lead of a chip he’s delivering to.

method_2

It is obvious that the requirements and goals for any tests at chip level are quite different. Most chip leads would first like to ensure that the core in question is indeed integrated at the chip level properly and the core does indeed talk to other cores properly.   The core ideally is a black box that would perform the functionality expected of it. The perspective on design verification maintained by the chip level verification engineer is usually vastly different from the block level perspective

Usually interconnect, clocking, reset, power-up/down, programming sequences, power domains, timing etc would be some examples  of things that come to mind when writing tests at the chip level. Once these major goals are met, one looks at other optimizations while attempting to verify the device.

That said, how does one now take the tests that are written for the block and re-use them at the top level especially if the tests are intended for different reasons? Is it even possible to minimize the effort in doing so? Don’t we need a mechanism to ensure that things that weren’t completely exercised at the block/subsystem level are tested at core level? What do we need for the handoff? How do the various verification class libraries now play a part in this picture?

The series herein explores how this is all done. A proper top/down methodology Coupled to a bottom’s up methodology can yield excellent results with minimal overlap.

Stay Tuned….

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One Response to “Moving from Block levels tests to a Chip level in a reusable world…”

  1. Kubendra Says:

    Nice idea to adopt top/down and bottom’s methodolgy

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